4 I/O Test Task

The I/O Test task serves to check the wiring of a distributed I/O device even before installing a CPU, and to protocol the test results in a quick, error-free and simple manner.

4.2 I/O Test Mode

In I/O Test mode, the screen consists of two main views:

“Device View” (1), a graphical representation of the tested device

The “Details” table (2) which shows you additional information about the tested device and the test in general.

Function Bar

The following function is available in the function bar:

Icon

Name

Function

 

Gefahr_ISO

WARNING

Manipulating the interfaces on control components can result in sudden movement of the machinery and the electrification of equipment.

Physical injury and electrical shock to personnel are consequently possible.

Make sure the machinery is in a safe state with no unauthorized personnel within range, before activating the I/O Test.

NOTE

To perform the I/O Test, PRONETA establishes a PROFINET application relation (AR) with the target device. Make sure that no other PROFINET controller occupies this connection.

The state of the I/O Test is indicated by the color of the “Device View” and “Details” table header bars:

Light green indicates the I/O Test is active. In addition, the words “Force Mode” appear at the right of the head bar.

Dark petrol indicates the I/O Test is inactive.

 

Device View

Usage

The device view shows a symbolic representation of the device you selected for the I/O Test mode. The status and I/O LEDs are updated in real time to reflect the state of the physical device.

To get a larger view of any module click the “+” symbol (1) above the module. A small Popup Window will appear.

Clicking on any of the modules here will show the module’s parameter table in the “Details” view, or highlight the corresponding section, depending on the tab chosen.

Modules with information in their diagnostics buffer are displayed with a red header.

Digital I/O

Click on any LED symbol of an output module to toggle the status of the corresponding output. Likewise, voltage applied to any input will light up the corresponding input module LED.

To force digital values, you can also use the “Test Results” tab in the Details View .

Analog I/O

Read analog values from input and output modules in the same fashion.

To force analog values, use either the Popup Window or the “Test Results” tab in the Details View.

NOTE

Optional plugged connection terminals (3DI/LC modules) of Motor Starter units will only be shown after Force mode has been activated.

Popup Window (I/O Test)

Usage

Above each module of the device in the Device View, a “+” symbol allows you to open a popup window with a larger symbolic view of the module’s inputs and outputs. If you open several modules, their popups will be arranged in a row within a single window.

Click the close icon “´” in the top right of the popup window segment, or the “-” symbol above the module in the device view, to close the popup for this module again. To close the whole window click the close icon “´” in the top right of the window. To rearrange the modules within the popup window, click the table header of the module in question and drag it to the desired position.

Digital I/O

Digital inputs and outputs can be monitored and forced, respectively, by viewing or checking and unchecking the fields corresponding to their connections. Green fields indicate active lines.

Analog I/O

For analog modules, symbolic channel names can be entered in the fields next to the indicated channel numbers. These will automatically be copied into the test protocol.

Analog output values can be forced by either entering the numeric value in the corresponding field, or by dragging the slider across the slider bar below. Clicking the symbol next to the field will reset the output to the default value.

 

Details Table

The Details Table consists of four tabs, each with its own function bar:

Parameters to set the module parameters

Test Results to perform and protocol the wiring test for the device

I/O Event Log to monitor regular events like the changes of input and output values of a module

Diagnostics to record irregular system events like the pulling and plugging of modules.

Parameters

This tab gives an overview over the parameter set of the module selected in the device view. Parameters can be only edited while “Force and Monitor Values” is not in operation (see I/O Test Mode, section “Function Bar”).

The parameter set can be stored to a file on disk, loaded from a file, and copied and pasted from the windows clipboard to transfer the parameters to a different module.

Function Bar

The following functions are available in the function bar:

Icon

Name

Function

 

The commands “Save Parameters” and “Load Parameters” transfer parameter sets between devices and are useful to configure a number of identical devices. Opposed to that, “Copy Parameters” and “Paste Parameters” are used predominantly to “clone” module configurations within one device.

Test Results

This tab offers the functionality for the actual I/O Test of the currently selected device.

The test table is vertically divided into sections according to the I/O modules present. Each section can be collapsed and expanded again by clicking on the triangle symbol “” in the section header.

The test table consists of the following columns:

NOTE

The I/O Test can be suspended and resumed at a later point in time by saving and loading the protocol.

After completion of the test, the protocol can be stored to document the proper wiring of the device. (See the Function Bar for details.)

Function Bar

The following functions are available in the function bar:

Icon

Name

Function

 

I/O Event Log

This tab records a log of all regular events (like changes of the values of inputs and outputs) which occurred to the modules while the I/O Test was active.

Clicking on a column header will sort the table accordingly.

Function Bar

The following functions are available in the function bar:

Icon

Name

Function

Diagnostics

The table in this tab shows a record of all irregular events which occurred to the device while the I/O Test was active, like the pulling of modules or a signal wire break.

If the diagnostics buffer contains events pertaining to a module, the corresponding module header in the Device Table will be displayed red.

Clicking on a column header of the table will sort the table accordingly.

Selecting a table entry will highlight the corresponding module in the Device View. In return, selecting a module in the Device View will highlight the first entry concerning the module in this table.

The table consists of the following columns:

“Slot”

“Module”

“Channel”

“Symbolic Name” (as entered in the test protocol tab)

“Description”

“Details”

“Time Stamp”